In 1981 a new revolutionary method of microscopy known as scanning probe microscopy (SPM) was invented and its applications have been increasing exponentially in diverse fields of life and physical sciences, engineering and technology. The development of this family of techniques resulted in a Nobel Prize.

Gerd Binnig and Heinrich Rohrer, both from IBM in Zurich, won the Nobel prize in 1986 for the invention of the Scanning Tunneling microscope. This technique gave birth to a family of scanning probe microscopy (SPM) instrumenatations. Their approach to solving the problem of imaging nanoscale objects is novel. Their solution was to literally feel the surface of the object with a very sharp probe. Very fine control on the movement of the probe was made possible by advances in piezoelectric technology. G. Binnig, C.F. Quate and C.H. Gerber developed the Atomic Force Microscope, in 1986, that could also be used to explore samples that are not electrically conductive.Previous microscopists observed small objects by bombarding them with electrons or electromagnetic radiations (light of various wavelengths).

 

SPM and the Nanotechnology Revolution

The engineering effort in the 1950's and 1960's that led to device miniaturization from millimeter to micrometer size scales was clearly a great technological achievement but scientifically it was relatively straightforward. However, a very different challenge arises in the new nanometer world as we approach limits where surface and interface effects become dominant. Nanotechnology stands out as a likely starting point to a new technological era because it focuses on perhaps the final engineering scales people have yet to master.

The importance and timeliness of materials science and engineering in the emerging fields of nanoscience and nanotechnology, driven by the electronics and biotechnology industries cannot be overstated. There is a big gap between the scale of individual molecular structures and the sub-microscopic components on microprocessors. That gap, which spans from about one nanometer to several hundred nanometers is where fundamental properties of materials are defined. Using SPMs, scientists and engineers can presently "see" and analyze the atomic and molecular landscapes of material surfaces. SPM-based force-feedback instruments are under development to manipulate nanostructures and "feel" and move the atoms and molecules on a material surface. The evolution of nanoscience and nanotechnology, resulting in better control over the way atoms and molecules assemble into tiny structures, will make possible in the near future an unprecedented technological capability to develop novel materials and advanced materials processes at the molecular and possibly atomic scale.

 

 

SPM is also beginning to emerge as a useful and popular technique for R&D, a quality control in several industries such as the semiconductor and biotechnology industries. Tremendous potential exists for the SPM due to the fact that it is a relatively inexpensive, easy to operate table-top family of instruments available for undergraduate science and engineering education innovations.

 

 

 

 

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