The term Scanning Probe Microscope is used to encompass a family
of related instruments. They include the:
(1) Scanning Tunneling Microscope - STM
(2) Atomic Force Microscope - AFM
(3) Force-Modulated AFM
(4) Lateral Force Microscope - LFM
(5) Magnetic Force Microscope - MFM
(6) Scanning Thermal Microscope - SThM
(7) Electrical Force Microscope - EFM and
(8) Near-field Scanning Optical Microscope - NSOM
This family of microscope is versatile in their use. One changes
the material and configuration of the probe and modifies the
detection scheme to determine different characteristics of a
sample.
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Microscope
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Interaction
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Information
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STM
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Tunneling
current
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3-D
topography: size, shape and periodicity of features, surface
roughness. Electronic structure, and possible elemental
identity.
|
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Contact
or intermittent contact AFM
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Interatomic
and intermolecular forces
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3-D
topography: size and shape and periodicity of features,
surface rough- ness.
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Force-Modulated
AFM
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Interatomic
and intermolecular forces
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Hardness
and surface elasticity at various locations.
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LFM
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Frictional
forces
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Differences
of adhesiveness and friction at various locations.
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MFM
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Magnetic
forces
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Size
and shape of magnetic features. Strength and polarity
of magnetic fields at different locations.
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SThM
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Heat
transfer
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Thermal
conductivity differences between surface features.
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EFM
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Electrostatic
forces
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Electrostatic
field gradients on the sample surface due to dopant concentrations..
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NSOM
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Reflection,
absorption and Fluorescence of light
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Optical
properties of surface features
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